Details
• Thickness measurement applications based on non-contact, non-destructive spectral reflectometry
• Suitable for measuring various semiconductor, medical and industrial components
• Measure parameters such as roughness, defects, and film thickness

Features
• Easy operation and quick measurement
• Multi-layer measurement
• Spectral Range can be customized as requested by the customer
• Measure substrates such as steel, aluminum, brass, copper, ceramics and plastics

Key Cases
• Applied to PLC thickness measurement
• Applied to SiN sample measurement